Overview
Emissions and Stack Auto Display Scan Flaw Detector for NDT Testing is designed to quickly, accurately, and non-destructively detect internal defects such as cracks, inclusions, and blowholes in various materials. This device features an advanced auto search and display scan function, allowing for efficient inspections with minimal manual adjustments. It is equipped with a high-resolution true-color LCD display with adjustable brightness for clear visibility in different lighting conditions. Multiple detection modes, including positive wave, negative wave, full wave, and radio frequency detection, ensure versatility for a wide range of applications. Built with a robust design and high waveform fidelity, this product is ideal for industries such as aerospace, railway, construction, metallurgy, shipbuilding, chemical, and petroleum for quality control, safety monitoring, and life assessment.
Features
- Quickly detects cracks, inclusions, and blowholes
- Auto search and display scan for faster inspections
- True-color LCD with adjustable brightness for any lighting
- Multiple detection modes for various testing needs
- High waveform fidelity for accurate results
- USB 2.0 interface for fast data transfer
- Durable design for industrial and field environments
- Suitable for aerospace, railway, construction, and more
Technical Specifications
| Working Principle | Ultrasonic |
| Working Frequency | 0.2 MHz to 20 MHz |
| Pulse Width | 30 ns to 1000 ns adjustable, step 0.1 ns |
| Detection Range | 0 in to 551.18 in (Steel longitudinal wave) |
| Pulse Shift | -1.77 in to 39.37 in (Steel longitudinal wave) |
| Material Sound Velocity | 984.25 ft/s to 49212.6 ft/s |
| Detection Method | Positive wave, negative wave, two-way wave, filter, RF wave |
| Gain Adjustment | 0 dB to 110 dB, step 0.1/1/2/6 |
| Sluice Gate | Incoming gate, loss gate; single or double gate reading |
| DAC / AVG Function | DAC curve, AVG curve |
| Attenuator Error | Every 12 dB ±1 dB |
| Vertical Linearity Error | ≤3% |
| Horizontal Linearity Error | ≤0.5% |
| Dynamic Range | ≥30 dB |
| Sensitivity Margin | ≥65 dB (2.5Z20N probe) |
| Far Zone Resolution | ≥26 dB |
| Electrical Noise Level | ≤10% (1 to 4 MHz) |
| Equivalent Input Noise | <80×10⁻⁹ V/√Hz |
| Pulse Repetition Frequency | 20 Hz to 1000 Hz, stepping 25 V |
| Pulse Voltage | 25 V to 400 V adjustable, step 25 V |
| Thin Plate Resolution | ≤0.12 in (5C10N probe) |
| Working Voltage | 12 V (Battery/DC) |
| Storage | Storage card |
| Probe Damping | 100 Ω, 200 Ω, 400 Ω optional |
| Real-Time Sampling | 10-bit AD converter, 160 MHz sampling |
| Filter Band | 0.2 MHz to 20 MHz, automatic matching |
| Communication Interface | USB 2.0 high-speed |
| Operating Temperature | 14 °F to 122 °F (-10 °C to 50 °C) |
| Weight | 15.43 lb (7 kg) |
| Dimensions | 7.09 in x 5.12 in x 1.57 in (180 mm x 130 mm x 40 mm) |
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