Crack Detector for Internal Defect Detection and Analysis – Emissions and Stack

Overview

Emissions and Stack Crack Detector for Internal Defect Detection and Analysis is a highly reliable non-destructive testing instrument designed for industrial applications. This product enables users to conveniently, quickly, and accurately detect, locate, evaluate, and diagnose internal defects such as cracks, looseness, pores, and inclusions in various workpieces. It is widely applied in industries such as electricity, petrochemicals, boilers and pressure vessels, steel structures, railway transportation, automobiles, and machinery. This device is equipped with a full-screen display for improved visibility, a large memory capacity capable of storing up to 1000 datasets, and advanced measurement functions that enhance defect detection accuracy. It supports automatic gain adjustment, alarm functions, solid waveform display, and defect localization and quantification features. With dual measuring gates, DAC curve functions, and bilingual operation interfaces, this product ensures precise results and ease of use in complex industrial environments.

Features

• Provides a full-screen display for clear and comprehensive visualization of echo signals.
• Offers a large storage capacity, supporting up to 1000 datasets including waveforms, curves, and parameters.
• Supports direct echo thickness measurement, eliminating the need for zero-point calibration.
• Features peak memory and real-time envelope display to record the maximum defect signal for accurate detection.
• Equipped with automatic gain adjustment to ensure consistent and reliable signal evaluation.
• Includes incoming and lost wave alarm functions to alert operators during inspections.
• Enhances visibility with a solid waveform display for quick defect scanning and detection.
• Provides real-time clock functionality for automatic recording of inspection data and time.
• Allows waveform freeze and gate movement for post-analysis of echo parameters.
• Displays defect localization values in sound path, horizontal, depth, and wave height for precise positioning.
• Offers real-time defect quantification with dB difference and SL quantification values.
• Built with dual measuring gates (A and B) for monitoring echo amplitude and sound path distance.
• Supports DAC curve functionality for accurate defect evaluation across varying depths.

Technical Specifications