Emissions and Stack Microprocessor Flaw Detector

This Microprocessor flaw detector has Sensitivity margin of ≥60 dB, continue working time of 10 hrs  and Measurement Range, 0 in to 393.7 in

SKU: EMSSFD-261 Category:

Features

  • Automated gain and gain scan
  • Peak Hold and Peak Memory
  • DAC, AVG, B scan, AWS, TCG curve
  • High-speed capture and very low noise
  • Automated make video of test process and play
  • Use USB flash disk, the length of video is unlimited
  • High contrast viewing of the waveform from bright, direct sunlight to complete darkness and easy to read from all angles
  • Automated display precise flaw location (Depth d, level p, distance s, amplitude, sz dB, Ø)
  • Automated switch three staff gauge (Depth d, level p, distance s)
  • Automated calibration of transducer Zero-point
  • Angles, Front edge and material Velocity
  • Convenient to make and use DAC/TCG and AVG to evaluate the echo, the curve can be modified and compensated 6dB DAC functions
  • 100 independence setups, any criterion can be input freely, we can work in the scene without test block
  • Big memory of 1000 A graph
  • Big memory of 300 A graph and 30000 thickness values
  • Li battery, continue working time up to 10 hrs
  • The embedded software can be online updated
  • Display freeze
  • Automated echo degree
  • Angles and K-value
  • Lock and unlock function of system parameters
  • Electronic clock calendar
  • Two gates setting and alarm indication
  • Gate and DAC alarm
  • Automated measurement of nodularity and vermicularity
  • RS232/USB port, Communication with PC is easy
  • Powerful pc software and reports can be exported to excel
  • Pulse parameters can be adjusted
  • Dormancy and screen savers
  • Solid metal housing (IP 65)

 

Technical Specifications

Vertical linearity error ≤2.5%
Sensitivity margin ≥60 dB
Continue working time 10 hrs
Measurement Range 0 in to 393.7 in (0 mm to 10000 mm)
Dimension 9.45 in x 7.09 in x 1.97 in(240 mm x 180 mm x 50 mm)
Net weight 3.96 lb (1.8 kg)

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